"Automatic comparison of striation marks and automatic classification of shoe prints"

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2567, Issue , 1995, Pages 151-164

  Geradts, Zeno ^a   Keijzer, Jan ^a   Keereweer, Isaac ^a  

^a Forensic Science Laboratory   (Netherlands)

Author keywords

Neural networks; Pattern recognition; Shoe profile; Shoeprints; Striations; Toolmarks

Indexed keywords

DATABASE SYSTEMS; NEURAL NETWORKS; PATTERN RECOGNITION;

AUTOMATIC CLASSIFICATION; FOURIER FEATURES; INVARIANT MOMENT; SEPARATE ELEMENT; SHOE PROFILE; SHOEPRINTS; STRIATIONS; TOOLMARKS;

IMAGE PROCESSING;

EID: 0000892685     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.218471     Document Type: Conference Paper

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