Coupled defect-level recombination: Theory and application to anomalous diode characteristics

Journal of Applied Physics

Volumn 78, Issue 5, 1995, Pages 3185-3192

  Schenk, Andreas ^a   Krumbein, Ulrich ^a  

^a ETH ZURICH   (Switzerland)

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Indexed keywords

EID: 0000889437     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360007     Document Type: Article

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