X-ray Diffraction-Line Broadening Analysis: Paracrystalline Method

Journal of Applied Crystallography

Volumn 30, Issue 2, 1997, Pages 147-152

  Somashekar, R ^a   Somashekarappa, H ^b  

^a UNIVERSITY OF MYSORE   (India)

^b UNIVERSITY OF MYSORE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000888178     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889896010023     Document Type: Article

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