Photoelectrochemical characterization of 6H-SiC

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 6089-6095

  Van De Lagemaat, J ^a   Vanmaekelbergh, D ^a   Kelly, J J ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000878455     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367479     Document Type: Article

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