Optically detected magnetic resonance as a tool to study the morphology of perylene-derivative thin film

Chemical Physics Letters

Volumn 300, Issue 5-6, 1999, Pages 626-632

  Lifshitz, E ^a   Kaplan, A ^a   Ehrenfreund, E ^a   Meissner, D ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000873002     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(98)01400-6     Document Type: Article

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