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Volumn 15, Issue 3, 1997, Pages 520-525

Extracting more chemical information from X-ray photoelectron spectroscopy by using monochromatic X rays

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000872146     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580677     Document Type: Article
Times cited : (11)

References (20)
  • 1
    • 0004165995 scopus 로고
    • ASTM, E902-93, American Society for Testing and Materials, Philadelphia, Vol. 03.06
    • ASTM, E902-93, 1994 Annual Book of ASTM Standards (American Society for Testing and Materials, Philadelphia, 1994), Vol. 03.06.
    • (1994) 1994 Annual Book of ASTM Standards
  • 3
    • 0000014708 scopus 로고
    • edited by D. Briggs and M. P. Seah Wiley, Chichester, App. 3
    • P. M. A. Sherwood, in Practical Surface Analysis, 2nd ed. edited by D. Briggs and M. P. Seah (Wiley, Chichester, 1990), App. 3, pp. 555-586.
    • (1990) Practical Surface Analysis, 2nd Ed. , pp. 555-586
    • Sherwood, P.M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.