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Volumn 57, Issue 7, 1994, Pages 651-741

Low temperature scanning electron microscopy of superconducting thin films and Josephson junctions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000869615     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/57/7/001     Document Type: Review
Times cited : (126)

References (291)
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    • Wilson, T1
  • 90
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    • Optical scanning microscopy-The laser scan microscope
    • (1985) Scanning , vol.7 , Issue.2 , pp. 88
    • Wilke, V1
  • 91
    • 84968075618 scopus 로고
    • The “SOMSEM”-An SEM-based scanning optical microscope
    • (1985) Scanning , vol.7 , Issue.2 , pp. 61
    • Maher, EF1
  • 103
    • 84968063721 scopus 로고
    • (1993)
  • 117
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  • 175
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    • Josephson-junction arrays in transverse magnetic fields: Ground states and critical currents
    • (1985) Physical Review B , vol.31 , Issue.9 , pp. 5728
    • Hasley, TC1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.