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Volumn 145, Issue 2, 1999, Pages 716-730

Synthesis and X-ray characterization of silicon clathrates

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EID: 0000856561     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1006/jssc.1999.8295     Document Type: Article
Times cited : (133)

References (25)
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