메뉴 건너뛰기




Volumn 86, Issue 12, 1999, Pages 7183-7185

Investigation of nanoscale Ge segregation in p-channel SiGe/Si field effect transistor structures by electron energy loss imaging

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000854450     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371810     Document Type: Article
Times cited : (19)

References (20)
  • 14
    • 0042528766 scopus 로고    scopus 로고
    • Ph.D. Thesis, Cambridge, UK, Chap. 4
    • C.-P. Liu, Ph.D. Thesis, Cambridge, UK, 1998, Chap. 4.
    • (1998)
    • Liu, C.-P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.