A statistical, nonparametric methodology for document degradation model validation

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 22, Issue 11, 2000, Pages 1209-1223

  Kanungo, Tapas ^a   Haralick, Robert M ^a   Baird, Henry S ^a   Stuezle, Werner ^a   Madigan, David ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Document degradation models; Model validation; Nonparametric statistical tests; OCR; Permutation tests; Simulation models

Indexed keywords

EID: 0000853826     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.888707     Document Type: Article

References (19)

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