Characterization of defects in glasses and coatings on glasses by microanalytical techniques

Mikrochimica Acta

Volumn 132, Issue 2-4, 2000, Pages 493-503

  Bange, Klaus ^a   Müller, Hartmut ^a   Strubel, Christine ^a  

^a SCHOTT AG   (Germany)

Author keywords

AFM; EPMA; Glass defects; LA ICP MS; TiO2 films

Indexed keywords

EID: 0000844146     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040050099     Document Type: Article

References (17)

1. W. Vogel, Glasfehler. Springer, Heidelberg New York Tokyo, 1993.
2. H. J. Marwedel, R. Brückner, Glastechnische Fabrikationsfehler, Springer, Berlin Heidelberg New York Tokyo, 1980.
3. P. Buchmayer, G. Buchmayer, Colour Picture Atlas of Stones and Inclusions in Glass. Oberland Glas AG, Bad Wurzach, 1996.
4. K. Bange, Properties and Characterization of Dielectric Thin Films. Thin films on glass. In: H. Bach, D. Krause (Eds.) Schott Series on glass and glass ceramics. Springer, Berlin Heidelberg New York Tokyo, 1997.
5. H. K. Pulker, Coatings on Glass, Elsevier, Amsterdam, 1984.
6. C. R. Ottermann, M. Heming, K. Bange, Mat. Res. Soc. Symp. Proc. 1995, 187, 356.
7. M. Valcárcel, R. Angel, Anal. Chem. 1993, 781, 65.
8. C. Strubel, L. Meckel, R. Effenberger, Glastech. Ber. Glass Sci. Technol. 1998, 77,12.
9. N. J. G. Pearce, W. T. Perkins, T. E. Jeffries, Geochim. Cosmochim. Acta 1993, 475, 57.
10. K. Simon, U. Wiechert, J. Hoefs, B. Grote, Fresenius' J. Anal. Chem. 1997, 458, 359.
11. K. Bange, Glastechn. Ber. Glass Sci. Technol. 1997, 238, 70.
12. X. Yu, H. Hantsche, Fresenius' J. Chem. 1993, 233, 346.
13. K. Bange, (in preparation).
14. C. Ottermann, K. Bange, Thin Solid Films 1996, 32, 286.
15. V. Majidi, M. R. Joseph, Crit. Rev. Anal. Chem. 1992, 23, 143.
16. I. Ahmad, B. J. Goddard, J. Fiz. Mat. 1993, 14,43.
17. L. J. Radziemski, Microchem. J. 1994, 50, 218.