Organic films deposited on Si p-n junctions: Accurate measurements of fluorescence internal efficiency, and application to luminescent antireflection coatings

Journal of Applied Physics

Volumn 80, Issue 8, 1996, Pages 4644-4648

  Garbuzov, D Z ^a   Forrest, S R ^a   Tsekoun, A G ^a   Burrows, P E ^a   Bulovic V ^a   Thompson, M E ^b  

^a PRINCETON UNIVERSITY   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000829232     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363447     Document Type: Article

References (11)

1. C. W. Tang, S. A. VanSlyke, and C. H. Chen, J. Appl. Phys. 65, 3610 (1989).
2. P. E. Burrows and S. R. Forrest, Appl. Phys. Lett. 64, 2285 (1993).
3. Z. Shen, P. Burrows, V. Bulović, S. Forrest, D. McCarthy, and M. Thompson, Jpn. J. Appl. Phys. 35, L401 (1996).
4. D. Z. Garbuzov, V. Bulović, P. E. Burrows, and S. R. Forrest, Chem. Phys. Lett. 249, 433 (1996).
5. M. A. Green, Solar Cells (Prentice-Hall, Englewood Cliffs, NJ, 1982), pp. 42-48.
6. Uncoated Si p-n photodiodes manufactured by Silicon Sensors Inc. (Dodgeville, WI 53533).
7. UV-enhanced photodiode Model-818-UV manufactured by Newport Co. (Irvine, CA 92714).
8. H. Liddell, Computer-aided Techniques for the Design of Multilayer Filters, (Hilger, Bristol, 1981), p. 119.
9. A. Fujii, M. Yoshida, Y. Ohmori, and K. Yoshino, Jpn. J. Appl. Phys. 34, L499 (1995).
10. W. Viehmann, SPIE Proc. 196, 90 (1979).
11. G. Sims, F. Griffin, and M. Lesser, SPIE Proc. 1071, 31 (1989).