Thickness dependence of the magnetic percolation threshold in as-deposited and annealed Fe-SiO2 granular thin films

Journal of Applied Physics

Volumn 84, Issue 10, 1998, Pages 5693-5697

  Zhou, J N ^a   Butera, A ^a   Jiang, H ^a   Barnard, J A ^a  

^a University of Alabama   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000821337     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368832     Document Type: Article

References (14)

1. K. Ichihara, A. Kikitsu, k. Yusu, F. Nakamura, and H. Ogiwara, IEEE Trans. Magn. 34, 1603 (1998).
2. A. Murayama, M. Miyamura, and S. Kondoh, J. Appl. Phys. 76, 5361 (1994).
3. A. Murayama, K. Hyomi, K. Ohshima, M. Miyamura, M. Maekawa, and S. Kondoh, J. Appl. Phys. 81, 3925 (1997).
4. C. L. Chien, J. Appl. Phys. 69, 5267 (1991).
5. C. L. Chien, Annu. Rev. Mater. Sci. 25, 129 (1995).
6. C. L. Chien, G. Xiao, and S. H. Liou, J. Phys. (France) 49, 1821 (1988).
7. G. Xiao and C. L. Chien, J. Appl. Phys. 63, 4252 (1988).
8. S. H. Liou and C. L. Chien, J. Appl. Phys. 63, 4240 (1988).
9. Z. S. Jiang, X. Ge, J. T. Ji, H. Sang, G. Guo, Y. W. Du, and S. Y. Zhang, J. Appl. Phys. 76, 6490 (1994).
10. R. L. Holtz, P. Lubitz, and A. S. Edelstein, Appl. Phys. Lett. 56, 943 (1990).
11. J. A. Christodoulides, N. B. Shevchenko, G. C. Hadjipanayis, and V. Papaefthymiou, J. Appl. Phys. 81, 5558 (1997).
12. A. Butera, T. J. Klemmer, and J. A. Barnard, J. Appl. Phys. 83, 4855 (1998).
13. E. C. Stoner and E. P. Wohlfarth, Philos. Trans. R. Soc. London, Ser. A 240, 599 (1948).
14. M. Sahimi, Applications of Percolation Theory (Taylor & Francis, London, 1994), Chap. 12 and references therein.