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Volumn 36, Issue 7, 1997, Pages 1354-1359

trans-Difluorosilicon(IV) Complexes of Tetra-p-tolylporphyrin and Tetrakis(p-(trifluoromethyl)phenyl)porphyrin: Crystal Structures and Unprecedented Reactivity in Hexacoordinate Difluorosilanes

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Indexed keywords


EID: 0000803703     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic960639x     Document Type: Article
Times cited : (32)

References (81)
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    • Scheidt, W. R. In The Porphyins; Dolphin, D., Ed.; Academic Press, Inc.: New York, 1978; Vol. 3; pp 463-511.
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    • XSCANS (version 2.0) is a diffractometer control system developed by Siemens Analytical X-ray Instruments, Madison, WI.
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    • SHELXL-93 is a FORTRAN-77 program (Professor G. Sheldrick, Institut fur Anorganische Chemie, University at Göttingen, D-37077 Göttingen, Germany) for single-crystal X-ray structural analysis.
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    • 1/2, where n is the number of reflections and P is the number of parameters varied during the last refinement cycle.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.