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0030263501
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Lorenz, C. R.; Dewald, H. H.; Lemke, F. R. J. Electroanal. Chem. 1996, 415, 179-181.
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(1996)
J. Electroanal. Chem.
, vol.415
, pp. 179-181
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Lorenz, C.R.1
Dewald, H.H.2
Lemke, F.R.3
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79
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0642353411
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note
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XSCANS (version 2.0) is a diffractometer control system developed by Siemens Analytical X-ray Instruments, Madison, WI.
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80
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0642292174
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note
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SHELXL-93 is a FORTRAN-77 program (Professor G. Sheldrick, Institut fur Anorganische Chemie, University at Göttingen, D-37077 Göttingen, Germany) for single-crystal X-ray structural analysis.
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81
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85088620704
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note
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1/2, where n is the number of reflections and P is the number of parameters varied during the last refinement cycle.
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