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Volumn 33, Issue 1-4, 1997, Pages 217-221

Copper metallization of Teflon AF1600, using evaporation and sputtering, for multilevel interconnect devices

Author keywords

[No Author keywords available]

Indexed keywords

CARBIDES; CHEMICAL BONDS; COPPER; CROSSLINKING; EVAPORATION; FLUORINE; METALLIZING; OXYGEN; SPUTTER DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0000799604     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-9317(96)00048-2     Document Type: Article
Times cited : (15)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.