4,4′-Bipyridyl at 203 K

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 4, 1999, Pages 672-674

  Boag, Neil M ^a   Coward, Kathleen M ^a   Jones, Anthony C ^a   Pemble, Martyn E ^a   Thompson, J Robin ^a  

^a UNIVERSITY OF SALFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000791667     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198016333     Document Type: Article

References (13)

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9. Sharma, C. V. K. & Zawarotko, M. J. (1996). J. Chem. Soc. Chem. Commun. pp. 2655-2656.
10. Sheldrick, G. M. (1995). SHELXTL-Plus. Release 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
11. Sheldrick, G. M. (1997). SHELXL97. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
12. Siemens (1996). XSCANS. Version 2.20. Data Collection Program for Use with P4 and P4/RA Diffractometers. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
13. Taylor, R. & Kennard, O. (1982). J. Am. Chem. Soc. 104, 5063-5070.