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Physical Review Letters

Volumn 30, Issue 26, 1973, Pages 1333-1336

Charge-carrier transport phenomena in amorphous SiO2: Direct measurement of the drift mobility and lifetime

(1) Hughes, R C a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000791441 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.30.1333 Document Type: Article

Times cited : (265)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.