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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 2291-2295

Ballistic electron emission microscopy spectroscopy study of AlSb and InAs/AlSb superlattice barriers

(2) Cheng, X C a McGill, T C a

a California Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000786006 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.590235 Document Type: Article

Times cited : (4)

References (16)

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