High-information time-resolved fourier transform spectroscopy at work

Applied Optics

Volumn 39, Issue 22, 2000, Pages 3984-3990

  Picqué, Nathalie ^a   Guelachvili, Guy ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; INTERFEROMETERS; SIGNAL TO NOISE RATIO;

INTERFEROGRAMS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0000779134     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.003984     Document Type: Article

References (20)

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