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Volumn 36, Issue 12, 1997, Pages 2594-2600

Syntheses and Single-Crystal X-ray Structures of a Series of Monosubstituted cis,cis-1,3,5-Triaminocyclohexane-Based Complexes

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000770050     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic9614529     Document Type: Article
Times cited : (27)

References (29)
  • 18
    • 1542584374 scopus 로고    scopus 로고
    • We have published structures of 7-9 in preliminary communications: 7 in ref 12 and 8 and 9 in ref 13
    • We have published structures of 7-9 in preliminary communications: 7 in ref 12 and 8 and 9 in ref 13.
  • 20
    • 1542794447 scopus 로고    scopus 로고
    • University of Newcastle-upon-Tyne
    • Clegg, W., University of Newcastle-upon-Tyne.
    • Clegg, W.1
  • 21
    • 0003579892 scopus 로고
    • Rigaku Corp., Tokyo, Japan
    • Hai-Fu, F. SAPI91, structure analysis programs with intelligent control, Rigaku Corp., Tokyo, Japan, 1993. Beurskens, P. T.; Admiraal, G. Beurskens, G.; Bosman, G.; Garcia-Granda, W. P.; Gould, R. O.; Smits, J. M. M.; Smykalla, C; the DIRDIF program system, technical report of the crystallographic laboratory, University of Nijmegen, The Netherlands, 1992. Sheldrick, G. M. SHELXL 93, program for crystal structure refinement. University of Gottingen. Germany.
    • (1993) SAPI91, Structure Analysis Programs with Intelligent Control
    • Hai-Fu, F.1
  • 23
    • 0004150157 scopus 로고    scopus 로고
    • University of Gottingen. Germany
    • Hai-Fu, F. SAPI91, structure analysis programs with intelligent control, Rigaku Corp., Tokyo, Japan, 1993. Beurskens, P. T.; Admiraal, G. Beurskens, G.; Bosman, G.; Garcia-Granda, W. P.; Gould, R. O.; Smits, J. M. M.; Smykalla, C; the DIRDIF program system, technical report of the crystallographic laboratory, University of Nijmegen, The Netherlands, 1992. Sheldrick, G. M. SHELXL 93, program for crystal structure refinement. University of Gottingen. Germany.
    • SHELXL 93, Program for Crystal Structure Refinement
    • Sheldrick, G.M.1
  • 24
    • 0003501257 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, WI
    • Smart and Saint area detector control and integration software. Siemens Analytical X-ray Instruments Inc., Madison, WI. Sheldrick, G. M. SHELXTL Version 5 1994. Siemens Analytical X-ray Instruments Inc., Madison, WI.
    • Smart and Saint Area Detector Control and Integration Software
  • 25
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, WI
    • Smart and Saint area detector control and integration software. Siemens Analytical X-ray Instruments Inc., Madison, WI. Sheldrick, G. M. SHELXTL Version 5 1994. Siemens Analytical X-ray Instruments Inc., Madison, WI.
    • (1994) SHELXTL Version 5
    • Sheldrick, G.M.1
  • 26
    • 0003653434 scopus 로고
    • Oak Ridge National Laboratory, Oak Ridge, TN
    • Johnson, C. K., ORTEP, Report ORNL-5138, Oak Ridge National Laboratory, Oak Ridge, TN, 1976.
    • (1976) ORTEP, Report ORNL-5138
    • Johnson, C.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.