The half-life of 126Sn refined by thermal ionization mass spectrometry measurements

International Journal of Mass Spectrometry

Volumn 184, Issue 2-3, 1999, Pages 145-152

  Oberli, Felix ^a   Gartenmann, Philipp ^a   Meier, Martin ^a   Kutschera, Walter ^b   Suter, Martin ^a   Winkler, Gerhard ^b  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF VIENNA   (Austria)

Author keywords

126Sn; Decay constant; Half life; Mass spectrometry; TIMS

Indexed keywords

EID: 0000767026     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1387-3806(98)14281-1     Document Type: Article

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