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Physical Review B

Volumn 43, Issue 11, 1991, Pages 9377-9380

Stress-induced layer-by-layer growth of Ge on Si(100)

(1) Tersoff, J a

a IBM RESEARCH (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000766946 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.43.9377 Document Type: Article

Times cited : (157)

References (20)

1
- 35949008471
- (1988) Phys. Rev. Lett. , vol.61 , pp. 1973
- Alerhand, O.L.¹ Vanderbilt, D.² Meade, R.D.³ Joannopolous, J.D.⁴

2
- 3342924439
- (1990) Phys. Rev. Lett. , vol.64 , pp. 2406
- Alerhand, O.L.¹ Berker, A.N.² Joannopolous, J.D.³ Vanderbilt, D.⁴ Hamers, R.J.⁵ Demuth, J.E.⁶

3
- 4243541851
- (1990) Phys. Rev. Lett. , vol.65 , pp. 2161
- Poon, T.W.¹ Yip, S.² Ho, P.S.³ Abraham, F.F.⁴

4
- 3643058644
- (1985) Phys. Rev. Lett. , vol.55 , pp. 765
- Ourmazd, A.¹ Bean, J.C.²

5
- 30244494913
- (1989) Phys. Rev. Lett. , vol.63 , pp. 1164
- Kelires, P.C.¹ Tersoff, J.²

6
- 4243921571
- (1990) Phys. Rev. Lett. , vol.64 , pp. 2038
- LeGoues, F.K.¹ Kesan, V.P.² Iyer, S.S.³ Tersoff, J.⁴ Tromp, R.⁵

7
- 3643130905
- (1990) Phys. Rev. Lett. , vol.64 , pp. 1943
- Eaglesham, D.J.¹ Cerullo, M.²

8
- 30244550961
- (1990) Phys. Rev. B , vol.42 , pp. 11690
- LeGoues, F.K.¹ Copel, M.² Tromp, R.M.³

9
- 84927894955
- Vanderbilt, D.¹ Wickham, L.K.²

10
- 0001267075
- (1985) J. Appl. Phys. , vol.58 , pp. 2577
- Asai, M.¹ Ueba, H.² Tatsuyama, C.³

11
- 0000687005
- (1985) Surf. Sci. , vol.155 , pp. 413
- Gossman, H.-J.¹ Feldman, L.C.² Gibson, W.M.³

12
- 3643143147
- (1990) Phys. Rev. Lett. , vol.65 , pp. 1020
- Mo, Y.-W.¹ Savage, D.E.² Swartzentruber, B.S.³ Lagally, M.G.⁴

13
- 0001053764
- (1988) Phys. Rev. Lett. , vol.61 , pp. 2469
- Men, F.K.¹ Packard, W.E.² Webb, M.B.³

14
- 29144453140
- (1966) Phys. Rev. , vol.145 , pp. 637
- Keating, P.N.¹

15
- 0001861786
- (1978) Surf. Sci. , vol.74 , pp. 21
- Appelbaum, J.A.¹ Hamann, D.R.²

16
- 25344472859
- (1989) Phys. Rev. Lett. , vol.63 , pp. 1404
- Meade, R.D.¹ Vanderbilt, D.²

17
- 0001819762
- Total energy and stress of metal and semiconductor surfaces
- (1989) Surface Science , vol.211-212 , pp. 1
- Payne, M.C.¹ Roberts, N.² Needs, R.J.³ Needels, M.⁴ Joannopoulos, J.D.⁵

18
- 84927894954
- Meade, R.D.¹ Vanderbilt, D.²

19
- 84927894953
- This more recent work includes refinements which are believed to make more accurate than the earlier calculation [R. D. Meade (private communication)].

20
- 6144258766
- (1990) Phys. Rev. B , vol.42 , pp. 11682
- Copel, M.¹ Reuter, M.C.² Horn von Hoegen, M.³ Tromp, R.M.⁴

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