Growth and characterization of thin Si80C20 films based upon Si4C building blocks

Applied Physics Letters

Volumn 72, Issue 8, 1998, Pages 930-932

  Kouvetakis, J ^a   Chandrasekhar, D ^a   Smith, David J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000764553     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120876     Document Type: Article

References (15)

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