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Applied Physics Letters

Volumn 73, Issue 18, 1998, Pages 2603-2605

Initial carrier relaxation dynamics in ion-implanted Si nanocrystals: Femtosecond transient absorption study

(4) Klimov, V I a Schwarz, Ch J a McBranch, D W a White, C W b

a LOS ALAMOS NATIONAL LABORATORY (United States)

b OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000762514 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.122519 Document Type: Article

Times cited : (76)

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