메뉴 건너뛰기




Volumn 69, Issue 15, 1996, Pages 2276-2278

Interface states at ultrathin oxide/Si(111) interfaces obtained from x-ray photoelectron spectroscopy measurements under biases

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000755385     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117532     Document Type: Article
Times cited : (31)

References (17)
  • 16
    • 0000358816 scopus 로고    scopus 로고
    • edited by H. Z. Massoud, E. H. Poindexter, and C. R. Helms The Electrochemical Society, Pennington, NJ
    • 2 Interface, edited by H. Z. Massoud, E. H. Poindexter, and C. R. Helms (The Electrochemical Society, Pennington, NJ, 1996), pp. 525-537.
    • (1996) 2 Interface , pp. 525-537
    • Stahbush, R.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.