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Volumn 67, Issue 6, 1996, Pages 2163-2170

2π spectrometer: A new apparatus for the investigation of ion surface interaction

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000750798     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147031     Document Type: Article
Times cited : (30)

References (20)
  • 4
    • 0038651241 scopus 로고
    • F. W. Meyer, S. H. Overbury, C. C. Havener, P. A. Zeijmans van Emmichoven, and D. M. Zehner, Phys. Rev. Lett. 67, 723 (1991); J. Das, L. Folkerts, and R. Morgenstern, Phys. Rev. A 45, 4669 (1992); S. Schippers, S. Hustedt, W. Heiland, R. Kohrbruck, J. Bleck-Neuhaus, J. Kemmler, D. Lecler, and N. Stolterfoht, ibid. 46, 4003 (1992).
    • (1992) Phys. Rev. A , vol.45 , pp. 4669
    • Das, J.1    Folkerts, L.2    Morgenstern, R.3
  • 13
    • 5244301335 scopus 로고
    • edited by T. Andersen, B. Fastrup, F. Folkmann, H. Knudsen, and N. O. Andersen AIP, New York
    • H. Winter, in XVIII ICPEAC Inv. Papers, AIP No. 295, edited by T. Andersen, B. Fastrup, F. Folkmann, H. Knudsen, and N. O. Andersen (AIP, New York, 1993).
    • (1993) XVIII ICPEAC Inv. Papers, AIP No. 295
    • Winter, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.