Self-consistent calculation of electron and hole inversion charges at silicon-silicon dioxide interfaces

Journal of Applied Physics

Volumn 59, Issue 9, 1986, Pages 3175-3183

  Moglestue, C ^a  

^a Marconi Research Center   (United Kingdom)

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[No Author keywords available]

Indexed keywords

EID: 0000737464     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.336898     Document Type: Article

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