Half-life measurement for the rp-process waiting point nuclide 80Zr

Physical Review Letters

Volumn 84, Issue 10, 2000, Pages 2104-2107

  Ressler, J J ^a   Piechaczek, A ^b   Walters, W B ^a   Aprahamian, A ^c   Wiescher, M ^c   Batchelder, J C ^d   Bingham, C R ^e,f   Brenner, D S ^g   Ginter, T N ^h   Gross, C J ^d,f   Grzywacz, R ^e   Kulp, D ⁱ   Mac Donald, B ⁱ   Reviol, W ^e   Rikovska, J ^a   Rykaczewski, K ^f,j   Winger, J A ^k   Zganjar, E F ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF NOTRE DAME   (United States)

^d OAK RIDGE ASSOCIATED UNIVERSITIES   (United States)

^e UNIVERSITY OF TENNESSEE   (United States)

^f OAK RIDGE NATIONAL LABORATORY   (United States)

^g CLARK UNIVERSITY   (United States)

^h VANDERBILT UNIVERSITY   (United States)

ⁱ GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^j UNIVERSITY OF WARSAW   (Poland)

^k MISSISSIPPI STATE UNIVERSITY   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000736459     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.2104     Document Type: Article

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