Simultaneous measurement of strain and temperature: Error analysis

Optical Engineering

Volumn 36, Issue 2, 1997, Pages 598-609

  Jin, Wei ^b,c,d,e   Michie, W Craig ^b,f   Thursby, Graham ^b   Konstantaki, Maria ^b   Culshaw, Brian ^a,b  

^a SPIE   (United Kingdom)

^b UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^c HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^d BEIHANG UNIVERSITY   (China)

^e IEEE   (Hong Kong)

^f UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Matrix element; Sensor resolution; Strain measurement; Temperature measurement

Indexed keywords

EID: 0000735158     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601233     Document Type: Article

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