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Volumn 39, Issue 16, 2000, Pages 2577-2583

Simultaneous measurement of pure curvature and twist distribution fields by a five-aperture shearing and two-Fourier filtering technique

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM NEON LASERS; IMAGE ANALYSIS; LASER BEAMS; VECTORS;

EID: 0000724837     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002577     Document Type: Article
Times cited : (11)

References (12)
  • 1
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    • R. F. Wuerker, ed., Proc. SPIE 41
    • Y. Y. Hung and C. E. Taylor, “Speckle-shearing interferometric camera-a tool for measurement of derivatives of surface displacements, ” in Developments in Laser Technology II, R. F. Wuerker, ed., Proc. SPIE 41, 169-175 (1973).
    • (1973) Developments in Laser Technology II , pp. 169-175
    • Hung, Y.Y.1    Taylor, C.E.2
  • 2
    • 0016071169 scopus 로고
    • A speckle-shearing interferometer: A tool for measuring derivatives of surface displacements
    • Y. Y. Hung, “A speckle-shearing interferometer: A tool for measuring derivatives of surface displacements, ” Opt. Commun. 11, 132-135 (1974).
    • (1974) Opt. Commun. , vol.11 , pp. 132-135
    • Hung, Y.Y.1
  • 3
    • 0016484778 scopus 로고
    • A new speckleshearing interferometer-a full-field strain gauge
    • Y. Y. Hung, I. M. Daniel, and R. E. Rowlands, “A new speckleshearing interferometer-a full-field strain gauge, ” Appl. Opt. 14, 618-622 (1975).
    • (1975) Appl. Opt. , vol.14 , pp. 618-622
    • Hung, Y.Y.1    Daniel, I.M.2    Rowlands, R.E.3
  • 4
    • 0018459211 scopus 로고
    • Image-shearing camera for direct measurement of surface strain
    • Y. Y. Hung and C. Y. Liang, “Image-shearing camera for direct measurement of surface strain, ” Appl. Opt. 18, 1046-1051 (1979).
    • (1979) Appl. Opt. , vol.18 , pp. 1046-1051
    • Hung, Y.Y.1    Liang, C.Y.2
  • 5
    • 0021422466 scopus 로고
    • Simultaneous measurement of slope and curvature with a three-aperture speckle shearing interferometer
    • D. K. Sharma, R. S. Sirohi, and M. P. Kothiyal, “Simultaneous measurement of slope and curvature with a three-aperture speckle shearing interferometer, ” Appl. Opt. 23, 1542-1546 (1984).
    • (1984) Appl. Opt. , vol.23 , pp. 1542-1546
    • Sharma, D.K.1    Sirohi, R.S.2    Kothiyal, M.P.3
  • 6
    • 84975600640 scopus 로고
    • Speckle and speckle-shearing interferometers combined for the simultaneous determination of out-of-plane displacement and slope
    • R. K. Mohanty, C. Jonathan, and R. S. Sirohi, “Speckle and speckle-shearing interferometers combined for the simultaneous determination of out-of-plane displacement and slope, ” Appl. Opt. 24, 3106-3109 (1985).
    • (1985) Appl. Opt. , vol.24 , pp. 3106-3109
    • Mohanty, R.K.1    Jonathan, C.2    Sirohi, R.S.3
  • 7
    • 0021409932 scopus 로고
    • Multiaperture speckle shearing arrangements for stress analysis
    • D. K. Sharma, R. S. Sirohi, and M. P. Kothiyal, “Multiaperture speckle shearing arrangements for stress analysis, ” Opt. Commun 49, 313-317 (1984).
    • (1984) Opt. Commun , vol.49 , pp. 313-317
    • Sharma, D.K.1    Sirohi, R.S.2    Kothiyal, M.P.3
  • 8
    • 0003335550 scopus 로고
    • Displacement and strain measurement
    • R. K. Erf, ed, Academic, New York
    • Y. Y. Hung, “Displacement and strain measurement, ” in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), pp. 51-71.
    • (1978) Speckle Metrology , pp. 51-71
    • Hung, Y.Y.1
  • 9
    • 0002985532 scopus 로고
    • Techniques of displacement and deformation measurements in speckle metrology
    • R. S. Sirohi, ed. (Marcel Dekker, New York
    • P. K. Rastogi, “Techniques of displacement and deformation measurements in speckle metrology, ” in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), pp. 41-98.
    • (1993) Speckle Metrology , pp. 41-98
    • Rastogi, P.K.1
  • 10
    • 0001816034 scopus 로고
    • Speckle methods in experimental mechanics
    • R. S. Sirohi, ed, Marcel Dekker, New York
    • R. S. Sirohi, “Speckle methods in experimental mechanics, ” in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), pp. 99-155.
    • (1993) Speckle Metrology , pp. 99-155
    • Sirohi, R.S.1
  • 11
    • 0028406182 scopus 로고
    • Direct determination of second-order derivatives in plate bending using multiple-exposure shearography
    • C. J. Tay, S. L. Toh, H. M. Shang, and Q. Y. Lin, “Direct determination of second-order derivatives in plate bending using multiple-exposure shearography, ” Opt. Laser Technol. 26, 91-98 (1994).
    • (1994) Opt. Laser Technol. , vol.26 , pp. 91-98
    • Tay, C.J.1    Toh, S.L.2    Shang, H.M.3    Lin, Q.Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.