Infrared transmission studies via lamellar gratings on Si wafer

Journal of Applied Physics

Volumn 83, Issue 3, 1998, Pages 1654-1659

  Hava, S ^a   Ivri, J ^a   Auslender, M ^a   Lacquet, B M ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b UNIVERSITY OF JOHANNESBURG   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000723530     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366880     Document Type: Article

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