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Volumn 57, Issue 3, 1998, Pages 2634-2639
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Aspects of self-organized criticality in a random driven interface model
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000723461
PISSN: 1063651X
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevE.57.2634 Document Type: Article |
Times cited : (2)
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References (17)
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