Low-temperature defect chemistry of oxides. II. Analytical relations

Journal of Applied Physics

Volumn 86, Issue 10, 1999, Pages 5434-5443

  Sasaki, K ^a,b   Maier, J ^b  

^a KYUSHU UNIVERSITY   (Japan)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000723384     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371542     Document Type: Article

References (20)

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13. n•] will be involved in the electroneutrality condition for (formula presented)
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15. K. Sasaki, P. Murugaraj, M. Haseidl, and J. Maier, in Proceedings of the 5th International Symposium on Solid Oxide Fuel Cells, edited by U. Stimming, S.C. Singhal, H. Tagawa, and W. Lehnert, The Electrochem. Soc. Proc. Series, PV 97-40 (The Electrochemical Society, Pennington, NJ, 1997), p. 1190.
16. 2 regimes.
17. M is assumed to be conservative.
18. S-M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981), Chap. 1, p. 26.
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20. J. Maier, J. Am. Ceram. Soc. 76, 1223 (1993).