Trichloro[methylenebis(diphenylphosphine oxide-O)]antimony(III)

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 2, 1999, Pages 172-174

  Razak, Ibrahm Abdul ^a   Fun, Hoong Kun ^a   Yamin, Bohari M ^b   Chinnakali, Kandasamy ^a,c   Zakaria, Hasbullah ^b   Ismail, Norismaliza Binti ^b  

^a SCHOOL OF PHYSICS   (Malaysia)

^b UNIVERSITI KEBANGSAAN MALAYSIA   (Malaysia)

^c ANNA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000719709     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198012335     Document Type: Article

References (10)

1. Carmalt, C. J., Cowley, A. H., Decken, A., Lawson, Y. G. & Norman N. C. (1996). Acta Cryst. C52, 931-933.
2. Golic, L. & Milicev, S. (1978). Acta Cryst. B34, 3379-3381.
3. Milicev, S. & Hadzi, D. (1977). Inorg. Chim. Acta, 21, 201-207.
4. Nardelli, M. (1995). J. Appl. Cryst. 28, 659.
5. Porter, S. K. & Jacobson, R. A. (1970). J. Chem. Soc. A, pp. 1356-1359.
6. Sheldrick, G. M. (1995). SHELXTL. Structure Determination Programs. Version 5. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
7. Sheldrick, G. M. (1996). SADABS. Program for Empirical Absorption Correction of Area Detector Data. University of Göttingen, Germany.
8. Siemens (1996a). SAINT Software Reference Manual. Version 4.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Siemens (1996b). SMART Software Reference Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
10. Yamin, B. M., Fun, H.-K., Sivakumar, K., Yip, B. C. & Shawkataly, O. B. (1996). Acta Cryst. C52, 600-602.