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This concept is consistent with the work of Ref. 11, which showed that exchange-biased CoCu multilayers can exhibit a large magnetoresistance without oscillatory AFM coupling.
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The comparisons in Figs. 1 and 2 are made in terms of Cu thickness in Å, which is the natural unit of measure since all groups use quartz-crystal-oscillator thin-film thickness monitors. In this way the same number of Cu atoms deposited per unit surface area by the different groups is being compared. A comparison in terms of Cu monolayers would be misleading unless the crystalline orientation of growth were known and were the same in the different experiments, since different crystal planes have different spacings.
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