SCOPUS 정보 검색 플랫폼

Volumn 52, Issue 11, 1995, Pages 8454-8460

Growth and morphology of Ni/Cu(100) ultrathin films: An in situ study using scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000714849 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.52.8454 Document Type: Article

Times cited : (119)

References (22)

4
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- O'Brien, W.L.¹ Tonner, B.P.²

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- (1994) Phys. Rev. B , vol.50 , pp. 13467
- Schultz, B.¹ Baberschke, K.²

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- (1993) Surf. Sci. , vol.298 , pp. 351
- Zhang, J.¹ Han, Z.-L.² Varma, S.³

9
- 84926908110
- Percolation as mathematically defined (finite probability of an infinite path) cannot be tested in our system. Instead, we use an operational definition—95% of islands of a given height must be interconnected on a representative 25times25-nm2 area before they are considered percolated.

11
- 0028465697
- (1994) Surf. Sci. , vol.313 , pp. 215
- Chambliss, D.D.¹ Johnson, K.E.²

21
- 0001552344
- IS FIG. 1. STM images of initially grown Ni/Cu(100) films. (a) 0.2-ML coverage, the darker area is the substrate surface;
- (1993) Phys. Rev. B , vol.48 , pp. 2855
- Schmid, A.K.¹ Atlan, D.² Itoh, H.³ Heinrich, B.⁴ Ichinokawa, T.⁵ Kirschner, J.⁶

22
- 84926889318
- (b) 0.7 ML. Note the minute amount of second-layer nuclei. .IE .IS FIG. 2. STM images of (a) 3.4 ML and (b) 4.5 ML Ni/Cu(100) films. At 3.4 ML, the third layer is almost completed with hardly any fifth-layer nuclei forming. At 4.5 ML, the fourth layer is slightly less completed than the third one at 3.4 ML, with a few sixth-layer nuclei appearing on the surface. Note that at 3.4 ML only a few island edges are in the [011] and [01 bar1] directions, which is more pronounced at 4.5 ML. .IE .IS FIG. 3. STM images of (a) 5.6-ML and (b) 7.1-ML Ni/Cu(100) films. At 5.6 ML, the fifth layer is at 95% closed, with a considerable amount of seventh-layer islands (9% of the whole area) present. At 7.1 ML, the layer filling of the sixth (darkest), seventh (second darkest), eighth (second brightest), and ninth (brightest) layers are 97%, 76%, 34%, and 3%, respectively. .IE .IS FIG. 4. STM images of (a) 16.9-ML and (b) 20.3-ML Ni/Cu(100) films. The 3D rectangular islands at these coverages are higher than those at lower coverages. Marked line profiles are shown in both images, indicating that the 3D islands are about 1 nm high in both films. .IE

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