Infrared-reflection characterization of sintered SiC thermoelectric semiconductors with the use of a four-component effective medium model

Journal of Applied Physics

Volumn 85, Issue 9, 1999, Pages 6728-6737

  Okamoto, Y ^a   Ordin, S V ^a,b   Kawahara, T ^a   Fedorov, M I ^a,b   Miida, Y ^a,c   Miyakawa, T ^a,c  

^a NATIONAL DEFENSE ACADEMY   (Japan)

^b IOFFE INSTITUTE   (Russian Federation)

^c CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000713619     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370186     Document Type: Article

References (19)

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