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Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 10, 1996, Pages 7481-7488

Variation of the in-plane penetration depth as a function of doping thin films on: Implications for the overdoped state

(9) Locquet, J a Jaccard, Y a Cretton, A a Williams, E a Arrouy, F a Machler E b Schneider, T b Fischer, O/ c Martinoli, P d

a UNIVERSITY OF ZURICH (Switzerland)

b IBM RESEARCH ZURICH (Switzerland)

c UNIVERSITY OF GENEVA (Switzerland)

d UNIVERSITY OF NEUCHÂTEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000713402 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.54.7481 Document Type: Article

Times cited : (54)

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