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Volumn 68, Issue 9, 1996, Pages 1214-1216

Role of ion energy in determination of the sp3 fraction of ion beam deposited carbon films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000713325     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115973     Document Type: Article
Times cited : (63)

References (30)
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  • 2
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    • Plasma Deposited Thin Films, edited by J. Mort and F. Jansen (CRC, Boca Raton, FL, 1986).
    • Plasma Deposited Thin Films, edited by J. Mort and F. Jansen (CRC, Boca Raton, FL, 1986).
  • 3
    • 21544449061 scopus 로고    scopus 로고
    • Ion Bombardment Modification of Surfaces: Fundamentals and Applications, edited by O. Auciello and R. Kelly (Elsevier, Amsterdam, 1987).
    • Ion Bombardment Modification of Surfaces: Fundamentals and Applications, edited by O. Auciello and R. Kelly (Elsevier, Amsterdam, 1987).
  • 6
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    • D. Marton, in Low Energy Ion-Surface Interactions, edited by J. W. Rabalais (Wiley, London, 1994), p. 481.
    • D. Marton, in Low Energy Ion-Surface Interactions, edited by J. W. Rabalais (Wiley, London, 1994), p. 481.
  • 7
    • 21544461717 scopus 로고    scopus 로고
    • Properties and Characterization of Amorphous Carbon Films, Mater. Sci. Forum. 52-53, edited by J. J. Pouch and S. A. Alterovitz (Trans. Tech, Aerdermannsdorf, 1990).
    • Properties and Characterization of Amorphous Carbon Films, Mater. Sci. Forum. 52-53, edited by J. J. Pouch and S. A. Alterovitz (Trans. Tech, Aerdermannsdorf, 1990).
  • 9
    • 21544484536 scopus 로고    scopus 로고
    • Y. Lifshitz, S. R. Kasi, and J. W. Rabalais, in Properties and Characterization of Amorphous Carbon Films, Mater. Sci. Forum. 52-53, edited by J. J. Pouch and S. A. Alterovitz (Trans. Tech., Aerdermannsdorf, 1990), p. 237.
    • Y. Lifshitz, S. R. Kasi, and J. W. Rabalais, in Properties and Characterization of Amorphous Carbon Films, Mater. Sci. Forum. 52-53, edited by J. J. Pouch and S. A. Alterovitz (Trans. Tech., Aerdermannsdorf, 1990), p. 237.
  • 10
    • 21544438694 scopus 로고    scopus 로고
    • E. F. Chaikovskii, V. M. Puzikov, and A. V. Semenov, Kristallografiya 26, 219 (1981) (Sov. Phys. Crystallogr. 26, 122 (1981).
    • E. F. Chaikovskii, V. M. Puzikov, and A. V. Semenov, Kristallografiya 26, 219 (1981) (Sov. Phys. Crystallogr. 26, 122 (1981).
  • 13
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    • J. P. Hirvonen, J. Koskinen, R. Lappalainen, and A. Antilla, in Properties and Characterization of Amorphous Carbon F, Mater. Sci. Forum 52-53, edited by J. J. Pouch and S. A. Alterovitz (Trans. Tech., Aerdermannsdorf, 1990), p. 197.
    • J. P. Hirvonen, J. Koskinen, R. Lappalainen, and A. Antilla, in Properties and Characterization of Amorphous Carbon F, Mater. Sci. Forum 52-53, edited by J. J. Pouch and S. A. Alterovitz (Trans. Tech., Aerdermannsdorf, 1990), p. 197.
  • 16
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    • (a) D. R. McKenzie, D. Muller, and B. Pailthrope, Phys. Rev. Lett. 67, 773 (1991). (b) D. R. McKenzie, Y. Yin, N. A. Marks, C. A. Davis, B. A. Pailthrope, G. A. J. Amaratunga, and V. S. Veerasamy, Diam. Relat. Mater. 3, 353 (1994).
    • (a) D. R. McKenzie, D. Muller, and B. Pailthrope, Phys. Rev. Lett. 67, 773 (1991). (b) D. R. McKenzie, Y. Yin, N. A. Marks, C. A. Davis, B. A. Pailthrope, G. A. J. Amaratunga, and V. S. Veerasamy, Diam. Relat. Mater. 3, 353 (1994).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.