Fast electron temperature diagnostic based on Langmuir probe current harmonic detection on DIII-D

Review of Scientific Instruments

Volumn 72, Issue 1 II, 2001, Pages 453-456

  Rudakov, D L ^a   Boedo, J A ^a   Moyer, R A ^a   Lehmer, R D ^a,c   Gunner, G ^a   Watkins, J G ^b  

^a UNIVERSITY OF CALIFORNIA SAN DIEGO   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c Logicon Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000707272     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1310577     Document Type: Article

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