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International Journal of Mass Spectrometry and Ion Processes
Volumn 157-158, Issue , 1996, Pages 391-403
Rapid microscale analyses with an external ion source Fourier transform ion cyclotron resonance mass spectrometer
(2)
Heeren, Ron M A
a
Boon, Jaap J
a
a
FOM INSTITUTE AMOLF
(
Netherlands
)
Author keywords
External ion source; FT ICR; MALDI; Microscale analysis
Indexed keywords
EID
:
0000695549
PISSN
:
01681176
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1016/S0168-1176(96)04468-0
Document Type
:
Article
Times cited : (
33
)
References (
41
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.
