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Volumn 38, Issue 5, 1988, Pages 3395-3399
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Electrical and optical properties of defects in silicon introduced by high-temperature electron irradiation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000676869
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.38.3395 Document Type: Article |
Times cited : (34)
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References (12)
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