Excited-state absorption measurement in Ge-doped SiO2 glass

Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2913-2915

  Fujimaki, Makoto ^a   Seol, Kwang Soo ^a   Ohki, Yoshimichi ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000676811     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363964     Document Type: Article

References (14)

1. M. J. Yuen, Appl. Opt. 21, 136 (1982).
2. L. Skuja, J. Non-Cryst. Solids 149, 77 (1992).
3. M. Kohketsu, K. Awazu, H. Kawazoe, and M. Yamane, Jpn. J. Appl. Phys. 28, 622 (1989).
4. H. Hosono, Y. Abe, D. L. Kinser, R. A. Weeks, K. Muta, and H. Kawazoe, Phys. Rev. B 46, 11 445 (1992).
5. M. Fujimaki, Y. Ohki, and H. Nishikawa, J. Appl. Phys. 81, 1042 (1997).
6. V. N. Bagratashvili, V. K. Popov, S. I. Tsypina, P. V. Cheraov, and A. O. Rybaltovskii, Opt. Lett. 20, 1619 (1995).
7. M. B. Danailov and P. Apai, Appl. Phys. Lett. 67, 3393 (1995).
8. R. M. Atkins and V. Mizrahi, Electron. Lett. 28, 1743 (1992).
9. G. Meltz, W. W. Morey, and W. H. Glenn, Opt. Lett. 14, 823 (1989).
10. L. Dong, J. L. Archambault, L. Reekie, P. St. J. Russell, and D. N. Payne, Appl. Opt. 34, 3436 (1995).
11. V. B. Neustruev, J. Phys.: Condens. Matter. 6, 6901 (1994).
12. M. Fujimaki, K. Yagi, Y. Ohki, H. Nishikawa, and K. Awazu, Phys. Rev. B 53, 9859 (1996).
13. J. Nishii, N. Kitamura, H. Yamanaka, H. Hosono, and H. Kawazoe, Opt. Lett. 20, 1184 (1995).
14. E. M. Dianov, D. S. Starodubov, and A. A. Frolov, Electron. Lett. 32, 246 (1996).