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Journal of Applied Physics

Volumn 57, Issue 8, 1985, Pages 2860-2879

Generation of positive charge in silicon dioxide during avalanche and tunnel electron injection

(1) Fischetti, Massimo V a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000675006 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.335223 Document Type: Article

Times cited : (155)

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