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Volumn 140, Issue 2, 1998, Pages 295-299
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Emf Measurements on Nanocrystalline Copper-Doped Ceria
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000669262
PISSN: 00224596
EISSN: None
Source Type: Journal
DOI: 10.1006/jssc.1998.7890 Document Type: Article |
Times cited : (44)
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References (14)
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