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Volumn 36, Issue 7, 1997, Pages 1472-1481

Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayers

Author keywords

Multilayers; Soft x rays; X ray microscopy

Indexed keywords


EID: 0000667597     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.001472     Document Type: Article
Times cited : (13)

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