-
1
-
-
0026495807
-
X-ray laser microscopy of rat sperm nuclei
-
L. B. Da Silva, J. E. Trebes, R. Balhorn, S. Mrowka, E. Anderson, D. T. Attwood, J. Gray, J. A. Coch, C. Lee, D. Kern, R. A. London, B. J. MacGowan, D. L. Matthews, and G. Stone, “X-ray laser microscopy of rat sperm nuclei,” Science 258, 269-271 (1992).
-
(1992)
Science
, vol.258
, pp. 269-271
-
-
Da Silva, L.B.1
Trebes, J.E.2
Balhorn, R.3
Mrowka, S.4
Anderson, E.5
Attwood, D.T.6
Gray, J.7
Coch, J.A.8
Lee, C.9
Kern, D.10
London, R.A.11
Macgowan, B.J.12
Matthews, D.L.13
Stone, G.14
-
2
-
-
18144440647
-
X-ray stereomicroscopy: High resolution 3-D imaging of human spermatozoa in aqueous suspension with natural contrast
-
B. W. Loo, S. Williams, S. Meizel and S. S. Rothman, “X-ray stereomicroscopy: high resolution 3-D imaging of human spermatozoa in aqueous suspension with natural contrast,” J. of Microsc. Oxford 166, RP5-RP6 (1992).
-
(1992)
J. Of Microsc. Oxford
, vol.166
, pp. RP5-RP6
-
-
Loo, B.W.1
Williams, S.2
Meizel, S.3
Rothman, S.S.4
-
3
-
-
0347002985
-
X-ray stereomicroscopy
-
Berliner ElektronenspeicherringGesellschaft fur Synchrotronstrahlung, Berlin
-
D. Rudolph, G. Schmahl, P. Guttmann, G. Schneider, J. Thi-eme, B. Niemann, C. David, and T. Wilhein, “X-ray stereomicroscopy,” in Annual Report (Berliner ElektronenspeicherringGesellschaft fur Synchrotronstrahlung, Berlin, 1993), pp. 413-419.
-
(1993)
Annual Report
, pp. 413-419
-
-
Rudolph, D.1
Schmahl, G.2
Guttmann, P.3
Schneider, G.4
Thi-Eme, J.5
Niemann, B.6
David, C.7
Wilhein, T.8
-
4
-
-
0003437440
-
-
Springer-Verlag, Berlin
-
A. G. Michette, G. R. Morrison, and C. J. Buckley, eds., X-ray Microscopy III (Springer-Verlag, Berlin, 1992).
-
(1992)
X-ray Microscopy III
-
-
Michette, A.G.1
Morrison, G.R.2
Buckley, C.J.3
-
5
-
-
0003696208
-
X-ray microscopy
-
A. G. Michette, “X-ray microscopy,” Rep. Prog. Phys. 51, 1525-1606 (1988).
-
(1988)
Rep. Prog. Phys.
, vol.51
, pp. 1525-1606
-
-
Michette, A.G.1
-
6
-
-
5944254993
-
Materials selection criteria for soft x-ray optics
-
S. Vitta, “Materials selection criteria for soft x-ray optics,”X-ray Sci. 4, 10-11 (1995).
-
(1995)
X-Ray Sci
, vol.4
, pp. 10-11
-
-
Vitta, S.1
-
7
-
-
0346659062
-
Multilayer x-ray mirrors: Interfacial roughness, scattering and image quality
-
E. Spiller, D. Stearns, and M. Krumrey, “Multilayer x-ray mirrors: interfacial roughness, scattering and image quality,”J. Appl. Phys. 74, 107-118 (1993).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 107-118
-
-
Spiller, E.1
Stearns, D.2
Krumrey, M.3
-
8
-
-
0001157614
-
X-ray diffraction measurement of partially correlated interfacial roughness in multilayers
-
Y. H. Phang, D. E. Savage, R. Kariotis, and M. G. Lagally, “X-ray diffraction measurement of partially correlated interfacial roughness in multilayers,” J. Appl. Phys. 74, 3181-3188(1993).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 3181-3188
-
-
Phang, Y.H.1
Savage, D.E.2
Kariotis, R.3
Lagally, M.G.4
-
9
-
-
36549094587
-
Interfacial reactions on annealing Mo-Si multilayers
-
K. Holloway, K. B. Do, and R. Sinclair, “Interfacial reactions on annealing Mo-Si multilayers,” J. Appl. Phys. 65, 474-480(1989).
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 474-480
-
-
Holloway, K.1
Do, K.B.2
Sinclair, R.3
-
10
-
-
36549095515
-
Nucleation-limited phase selection during reactions in Ni/a-Si multilayer thin films
-
L. A. Clevenger and C. V. Thompson, “Nucleation-limited phase selection during reactions in Ni/a-Si multilayer thin films,” J. Appl. Phys. 67, 1325-1333 (1990).
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 1325-1333
-
-
Clevenger, L.A.1
Thompson, C.V.2
-
11
-
-
0041792325
-
Improvement of the thermal stability of W/C multilayers, J. Appl
-
Z. Jiang, V. Dupis, B. Vidal, M. F. Ravet, and M. Piecuch, “Improvement of the thermal stability of W/C multilayers,” J. Appl. Phys. 72, 931-937 (1992).
-
(1992)
Phys.
, vol.72
, pp. 931-937
-
-
Jiang, Z.1
Dupis, V.2
Vidal, B.3
Ravet, M.F.4
Piecuch, M.5
-
12
-
-
0042021426
-
Metal mediated crystallization of a-Si in Si-Ag layered systems
-
T. J. Konno and R. Sinclair, “Metal mediated crystallization of a-Si in Si-Ag layered systems,” Philos. Mag. B 71, 163-178(1995).
-
(1995)
Philos. Mag. B
, vol.71
, pp. 163-178
-
-
Konno, T.J.1
Sinclair, R.2
-
13
-
-
0001392515
-
The atomic scattering factors for 94 elements in the 100-2000 eV photon energy region
-
D. T. Attwood and B. L. Henke, eds. (AIP, New York
-
B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro, and B. K. Fujikawa, “The atomic scattering factors for 94 elements in the 100-2000 eV photon energy region,” in Low Energy X-Ray Diagnostics, D. T. Attwood and B. L. Henke, eds. (AIP, New York, 1981), pp. 340-387.
-
(1981)
Low Energy X-Ray Diagnostics
, pp. 340-387
-
-
Henke, B.L.1
Lee, P.2
Tanaka, T.J.3
Shimabukuro, R.L.4
Fujikawa, B.K.5
-
14
-
-
0026237736
-
The limits of glass formation by pulsed laser quenching in Nb-Ni alloys
-
S. Vitta, “The limits of glass formation by pulsed laser quenching in Nb-Ni alloys,” Scr. Metall. Mater. 25, 2209-2214 (1991).
-
(1991)
Scr. Metall. Mater.
, vol.25
, pp. 2209-2214
-
-
Vitta, S.1
-
15
-
-
84984135062
-
A modified plasma source for controlled layer thickness synthesis in laser pulse vapor deposition
-
R. Dietsch, H. Mai, W. Pompe, and S. Vollmar, “A modified plasma source for controlled layer thickness synthesis in laser pulse vapor deposition,” Adv. Mater. Opt. Electron. 2, 19-29(1993).
-
(1993)
Adv. Mater. Opt. Electron.
, vol.2
, pp. 19-29
-
-
Dietsch, R.1
Mai, H.2
Pompe, W.3
Vollmar, S.4
-
16
-
-
0029244915
-
The new PTB reflectometer at BESSY
-
D. Fuchs, M. Krumrey, P. Muller, F. Scholze, and G. Ulm, “The new PTB reflectometer at BESSY,” Rev. Sci. Instrum. 66, 2248-2250 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 2248-2250
-
-
Fuchs, D.1
Krumrey, M.2
Muller, P.3
Scholze, F.4
Ulm, G.5
-
17
-
-
0000673317
-
Reflectivity oscillations at grazing incidence in thin Ni films
-
H. Kiessig, “Reflectivity oscillations at grazing incidence in thin Ni films,” Ann. Phys. N.Y. 10, 715-725 (1931).
-
(1931)
Ann. Phys. N.Y.
, vol.10
, pp. 715-725
-
-
Kiessig, H.1
-
19
-
-
0001682365
-
Synthetic multilayers as Bragg diffractors for x-rays and extreme ultraviolet
-
D. T. Attwood and B. L. Henke, eds. (AIP, New York
-
J. H. Underwood and T. W. Barbee, “Synthetic multilayers as Bragg diffractors for x-rays and extreme ultraviolet,” in Low Energy X-ray Diagnostics, D. T. Attwood and B. L. Henke, eds. (AIP, New York, 1981), pp. 170-178.
-
(1981)
Low Energy X-Ray Diagnostics
, pp. 170-178
-
-
Underwood, J.H.1
Barbee, T.W.2
-
20
-
-
26144449160
-
Surface studies of solids by total reflection of x-rays
-
L. G. Parrat, “Surface studies of solids by total reflection of x-rays,” Phys. Rev. 95, 359-369 (1954).
-
(1954)
Phys. Rev.
, vol.95
, pp. 359-369
-
-
Parrat, L.G.1
-
21
-
-
0028421868
-
XUV Mo/Si multilayer mirrors deposited by RF-magnetron sputtering
-
C. Montcalm, B. T. Sullivan, H. Pepin, J. A. Dobrowolski, and M. Sutton, “XUV Mo/Si multilayer mirrors deposited by RF-magnetron sputtering,” Appl. Opt. 33, 2057-2065 (1994).
-
(1994)
Appl. Opt
, vol.33
, pp. 2057-2065
-
-
Montcalm, C.1
Sullivan, B.T.2
Pepin, H.3
Dobrowolski, J.A.4
Sutton, M.5
-
22
-
-
0017632484
-
Columnar microstructure in vapor deposited thin films
-
A. G. Dirks and H. J. Leamy, “Columnar microstructure in vapor deposited thin films,” Thin Solid Films 47, 219-233 (1977).
-
(1977)
Thin Solid Films
, vol.47
, pp. 219-233
-
-
Dirks, A.G.1
Leamy, H.J.2
-
23
-
-
0001254055
-
Dependence of thin film microstructure on deposition rate by means of a computer simulation
-
K.-H. Muller, “Dependence of thin film microstructure on deposition rate by means of a computer simulation,” J. Appl. Phys. 58, 2573-2576 (1985).
-
(1985)
J. Appl. Phys
, vol.58
, pp. 2573-2576
-
-
Muller, K.-H.1
-
24
-
-
4243899002
-
Nonspecular x-ray reflection from rough multilayers
-
V. Holy and T. Baumbach, “Nonspecular x-ray reflection from rough multilayers,” Phys. Rev. B 49, 10668-10676 (1994).
-
(1994)
Phys. Rev. B
, vol.49
, pp. 10668-10676
-
-
Holy, V.1
Baumbach, T.2
|