Topographic and spectroscopic analysis of ethylene adsorption on Si(111)7×7 by STM and STS

Physical Review B

Volumn 48, Issue 24, 1993, Pages 17892-17896

  Piancastelli, M N ^a   Motta, N ^a   Sgarlata, A ^a   Balzarotti, A ^a   De Crescenzi, M ^b  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b UNIVERSITY OF CAMERINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000663348     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.48.17892     Document Type: Article

References (15)

1. Atomic-Resolution Surface Spectroscopy with the Scanning Tunneling Microscope
2. Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy