Optical properties of GaAs/AGAs quantum wells disordered by ion implantation

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 3, 1997, Pages 1509-1515

  Shtrichman, I ^a   Gershoni, D ^a   Kalish, R ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000660866     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.1509     Document Type: Article

References (22)

1. S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981).
2. H. Leier, A. Forchel, B. E. Maile, G. Mayer, J. Hommel, G. Weimann, and W. Schlapp, Appl. Phys. Lett. 56, 48 (1990).
3. F. E. Prins, G. Lehr, M. Burkard, S. Y. Nikitin, H. Schweizer, and G. W. Smith, Jpn. J. Appl. Phys. 1 32, 6228 (1993).
4. F. Laruelle, P. Hu, R. Simes, R. Kubena, W. Robinson, J. Merz, and P. M. Petroff, J. Vac. Sci. Technol. B 7, 2034 (1989).
5. J. Cibert, P. M. Petroff, G. J. Dolan, S. J. Pearton, A. C. Gossard, and J. H. English, Appl. Phys. Lett. 49, 1275 (1986).
6. M. Bode and A. Ourmazd, J. Vac. Sci. Technol. B 10, 1787 (1992).
7. M. Bode, A. Ourmazd, J. A. Rentschler, M. Hong, L. C. Feldman, and J. P. Mannaerts, in Beam-Solid Interactions: Physical Phenomena, edited by J. A. Knapp, P. Borgesen, and R. A. Zuhr, MRS Symposia Proceedings No. 157 (Materials Research Society, Pittsburgh, 1989), p. 197.
8. R. Kalish, L. C. Feldman, D. C. Jacobson, B. E. Weir, J. L. Merz, L.-Y. Kramer, K. Doughty, S. Stone, and K.-K. Lau, Nucl. Instrum. Methods Phys. Res. B 80/81, 729 (1993).
9. C. Vieu, M. Schneider, G. Benassayag, R. Planel, L. Birotheau, J. Y. Marzin, and B. Descouts, J. Appl. Phys. 71, 5012 (1992).
10. R. Kalish, L.-Y. Kramer, K.-K. Law, J. L. Merz, L. C. Feldman, D. C. Jacobson, and B. E. Weir, Appl. Phys. Lett. 61, 2589 (1992).
11. L. B. Allard, G. C. Aers, P. G. Piva, P. J. Poole, M. Buchanan, I. M. Templeton, T. E. Jackman, S. Charbonneau, U. Akano, and I. V. Mitchell, Appl. Phys. Lett. 64, 2412 (1994).
12. S. Alexander, Y. Rabin, and R. Zeitak, J. Chem. Phys. 95, 2012 (1991).
13. J. Cibert, P. M. Petroff, D. J. Werder, S. J. Pearton, A. C. Gossard, and J. H. English, Appl. Phys. Lett. 49, 223 (1986).
14. C. Bosio, J. L. Staehli, M. Guzzi, G. Burri, and R. A. Logan, Phys. Rev. B 38, 3263 (1988).
15. L. C. Andreani and A. Pasquarello, Superlatt. Microstruct. 5, 59 (1989).
16. Europhys. Lett. 6, 259 (1988).
17. A. T. Meney, J. Appl. Phys. 72, 5729 (1992).
18. L. C. Andreani, F. Tassone, and F. Bassani, Solid State Commun. 84, 281 (1992).
19. M. Colocci, M. Gurioli, and J. Martinez-Pastor, J. Phys. (France) IV Colloq. 3, C5 (1993).
20. D. S. Citrin, Phys. Rev. B 47, 3832 (1993).
21. P. Michler, A. Hangleiter, M. Moser, M. Geiger, and F. Scholz, Phys. Rev. B 46, 7280 (1992).
22. B. Deveaud, A. Chomette, D. Morris, and A. Regreny, Solid State Commun. 85, 367 (1993).