Microscale mechanics for metal thin film delamination along ceramic substrates

Science in China, Series A: Mathematics, Physics, Astronomy

Volumn 43, Issue 5, 2000, Pages 509-516

  Wei, Yueguang ^a  

^a INSTITUTE OF MECHANICS   (China)

Author keywords

Metal thin film; Microscale mechanics; Nonlinear delamination

Indexed keywords

EID: 0000658519     PISSN: 10069283     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02897142     Document Type: Article

References (15)

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