Effect of substrate roughness on microstructure, uniaxial anisotropy, and coercivity of Co/Pt multilayer thin films

Journal of Applied Physics

Volumn 75, Issue 10, 1994, Pages 6864-6866

  Chang, Chung Hee ^a   Kryder, Mark H ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000646880     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.356810     Document Type: Article

References (12)